SEVANI, N.; CUVIANTO, L.; OCTAVIANY, J. Enhanced Image Classification by Eliminating Outliers with the Combination of Feature Selection and K-means Techniques. Khazanah Informatika : Jurnal Ilmu Komputer dan Informatika, [S. l.], v. 10, n. 1, p. 22–29, 2024. DOI: 10.23917/khif.v10i1.4834. Disponível em: https://journals2.ums.ac.id/khif/article/view/4834. Acesso em: 13 apr. 2026.